Digital Library
Search: "[ keyword: Application Test ]" (2)
A Test Case Generation Techniques Based on J2ME Platform
Sang Il Kim , Myong Ki Roh , Sung Yul Rhew The KIPS Transactions:PartD,
Vol. 13, No. 2, pp. 215-222,
Apr.
2006
10.3745/KIPSTD.2006.13.2.215
10.3745/KIPSTD.2006.13.2.215
Image-Based Application Testing Method Using Faster D2-Net for Identification of the Same Image
Chun Hye-Won, Jo Min-Seok, Han Sung-Soo, Jeong Chang-Sung KIPS Transactions on Software and Data Engineering,
Vol. 11, No. 2, pp. 87-92,
Feb.
2022
https://doi.org/10.3745/KTSDE.2022.11.2.87
Keywords: Application Test, Deep Learning, Image matching, Feature matching, Image Compare
https://doi.org/10.3745/KTSDE.2022.11.2.87
Keywords: Application Test, Deep Learning, Image matching, Feature matching, Image Compare
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Vol. 13, 2024
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Vol. 12, 2023
- Vol. 12, No. 12 (Dec. 2023)
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Vol. 11, 2022
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Vol. 10, 2021
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Vol. 9, 2020
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Vol. 8, 2019
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Vol. 7, 2018
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Vol. 1, 2012
Old Journals
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All publications of KTSDE is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTSDE is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
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